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  april 2009 ?2009 fairchild semiconductor corporation FDMS7670 rev . d www.fairchildsemi.com 1 FDMS7670 n-channel powertrench ? mosfet FDMS7670 n-channel powertrench ? mosfet 30 v, 3.8 m ? features ? max r ds(on) = 3.8 m ? at v gs = 10 v, i d = 21 a ? max r ds(on) = 5.0 m ? at v gs = 4.5 v, i d = 17 a ? advanced package and silicon design for low r ds(on) and high efficiency ? next generation enhanced body diode technology, engineered for soft recovery. provides sc hottky-like performance with minimum emi in sync buc k converter applications ? msl1 robust package design ? 100% uil tested ? rohs compliant general description this n-channel mosfet has been designed specifically to improve the overall efficiency and to minimize switch node ringing of dc/dc converters us ing either synchronous or conventional switching pwm cont rollers. it has been optimized for low gate charge, low r ds(on) , fast switching speed and body diode reverse recovery performance. applications ? imvp vcore switching for notebook ? vrm vcore switching for desktop and server ? oringfet / load switch ? dc-dc conversion bottom power 56 top pin 1 g s s s d d d d g s s s d d d d 5 6 7 8 3 2 1 4 mosfet maximum ratings t a = 25 c unless otherwise noted thermal characteristics package marking and ordering information symbol parameter ratings units v ds drain to source voltage 30 v v gs gate to source voltage (note 4) 20 v i d drain current -continuous (package limited) t c = 25 c 42 a -continuous (silicon limited) t c = 25 c 105 -continuous t a = 25 c (note 1a) 21 -pulsed 150 e as single pulse avalanche energy (note 3) 144 mj p d power dissipation t c = 25 c 62 w power dissipation t a = 25 c (note 1a) 2.5 t j , t stg operating and storage junction temperature range -55 to +150 c r jc thermal resistance, junction to case 2.0 c/w r ja thermal resistance, junction to ambient (note 1a) 50 device marking device package reel size tape width quantity FDMS7670 FDMS7670 power 56 13 ?? 12 mm 3000 units
www.fairchildsemi.com 2 FDMS7670 rev . d FDMS7670 n-channel powertrench ? mosfet electrical characteristics t j = 25 c unless otherwise noted off characteristics on characteristics dynamic characteristics switching characteristics drain-source diod e characteristics symbol parameter test conditions min typ max units bv dss drain to source breakdown voltage i d = 250 a, v gs = 0 v 30 v ? bv dss ? t j breakdown voltage temperature coefficient i d = 250 a, referenced to 25 c 15 mv / c i dss zero gate voltage drain current v ds = 24 v, v gs = 0 v 1 a i gss gate to source leakage current, forward v gs = 20 v, v ds = 0 v 100 na v gs(th) gate to source threshold voltage v gs = v ds , i d = 250 a 1.25 1.9 3.0 v ? v gs(th) ? t j gate to source threshold voltage temperature coefficient i d = 250 a, referenced to 25 c -7 mv/c r ds(on) static drain to source on resistance v gs = 10 v, i d = 21 a 2.9 3.8 m ? v gs = 4.5 v, i d = 17 a 4.1 5.0 v gs = 10 v, i d = 21 a, t j = 125 c 4.0 5.3 g fs forward transconductance v ds = 5 v, i d = 21 a 136 s c iss input capacitance v ds = 15 v, v gs = 0 v, f = 1 mhz 3085 4105 pf c oss output capacitance 990 1315 pf c rss reverse transfer capacitance 75 115 pf r g gate resistance 1.2 2.5 ? t d(on) turn-on delay time v dd = 15 v, i d = 21 a, v gs = 10 v, r gen = 6 ? 15 26 ns t r rise time 612ns t d(off) turn-off delay time 31 50 ns t f fall time 510ns q g total gate charge v gs = 0 v to 10 v v dd = 15 v, i d = 21 a 40 56 nc q g total gate charge v gs = 0 v to 4.5 v 17 24 nc q gs gate to source charge 9.8 nc q gd gate to drain ?miller? charge 4.4 nc v sd source to drain diode forward voltage v gs = 0 v, i s = 2.1 a (note 2) 0.7 0.95 v v gs = 0 v, i s = 21 a (note 2) 0.8 1.1 t rr reverse recovery time i f = 21 a, di/dt = 100 a/ s 38 61 ns q rr reverse recovery charge 19 34 nc t a reverse recovery fall time 14 ns t b reverse recovery rise time 24 ns s softness (t b /t a ) 1.7 t rr reverse recovery time i f = 21 a, di/dt = 300 a/ s 32 51 ns q rr reverse recovery charge 34 54 nc notes : 1. r ja is determined with the device mounted on a 1in 2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of fr-4 material. r jc is guaranteed by design while r ca is determined by the user's board design. 2. pulse test: pulse width < 30 0 s, duty cycle < 2.0%. 3. e as of 144 mj is based on starting t j = 25 c, l = 1 mh, i as = 17 a, v dd = 27 v, v gs = 10 v. 100% test at l = 0.3 mh, i as = 22 a. 4. as an n-ch device, the negative vgs rating is for low duty cycle pulse occurrence only. no continuous rating is implied. a. 50 c/w when mounted on a 1 in 2 pad of 2 oz copper. b. 125 c/w when mounted on a minimum pad of 2 oz copper.
www.fairchildsemi.com 3 FDMS7670 rev . d FDMS7670 n-channel powertrench ? mosfet typical characteristics t j = 25 c unless otherwise noted figure 1. 0.0 0.5 1.0 1.5 2.0 0 30 60 90 120 150 v gs = 3.5 v v gs = 10 v pulse duration = 80 s duty cycle = 0.5% max v gs = 4 v v gs = 5 v v gs = 4.5 v i d , drain current (a) v ds , drain to source voltage (v) on region characteristics figure 2. 0306090120150 0 1 2 3 4 5 v gs = 3.5 v pulse duration = 80 s duty cycle = 0.5% max normalized drain to source on-resistance i d , drain current (a) v gs = 4 v v gs = 4.5 v v gs = 5 v v gs = 10 v n o r m a l i z e d o n - r e s i s t a n c e vs drain current and gate voltage f i g u r e 3 . n o r m a l i z e d o n r e s i s t a n c e -75 -50 -25 0 25 50 75 100 125 150 0.6 0.8 1.0 1.2 1.4 1.6 i d = 21 a v gs = 10 v normalized drain to source on-resistance t j , junction temperature ( o c ) vs junction temperature figure 4. 246810 0 3 6 9 12 15 t j = 125 o c i d = 21 a t j = 25 o c v gs , gate to source voltage (v) r ds(on) , drain to source on-resistance ( m ? ) pulse duration = 80 s duty cycle = 0.5% max o n - r e s i s t a n c e v s g a t e t o source voltage figure 5. transfer characteristics 12345 0 30 60 90 120 150 t j = 150 o c v ds = 5 v pulse duration = 80 s duty cycle = 0.5% max t j = -55 o c t j = 25 o c i d , drain current (a) v gs , gate to source voltage (v) figure 6. 0.0 0.2 0.4 0.6 0.8 1.0 1.2 0.001 0.01 0.1 1 10 100 t j = -55 o c t j = 25 o c t j = 150 o c v gs = 0 v i s , reverse drain current (a) v sd , body diode forward voltage (v) 500 s o u r c e t o d r a i n d i o d e forward voltage vs source current
www.fairchildsemi.com 4 FDMS7670 rev . d FDMS7670 n-channel powertrench ? mosfet figure 7. 0 10203040 0 2 4 6 8 10 i d = 21 a v dd = 20 v v dd = 10 v v gs , gate to source voltage (v) q g , gate charge (nc) v dd = 15 v gate charge characteristics figure 8. 0.1 1 10 100 1000 50 f = 1 mhz v gs = 0 v capacitance (pf) v ds , drain to source voltage (v) c rss c oss c iss 30 5000 c a p a c i t a n c e v s d r a i n to source voltage figure 9. 0.01 0.1 1 10 100 1000 1 10 100 t j = 100 o c t j = 25 o c t j = 125 o c t av , time in avalanche (ms) i as , avalanche current (a) 40 u n c l a m p e d i n d u c t i v e switching capability figure 10. 25 50 75 100 125 150 0 20 40 60 80 100 120 v gs = 4.5 v limited by package r jc = 2.0 o c/w v gs = 10 v i d , drain current (a) t c , case temperature ( o c ) m a x i m u m c o n t i n u o u s d r a i n current vs case temperature f i g u r e 1 1 . f o r w a r d b i a s s a f e operating area 0.01 0.1 1 10 100 0.01 0.1 1 10 100 10 s 1 s dc 100 ms 10 ms 1 ms 100 us i d , drain current (a) v ds , drain to source voltage (v) 300 this area is limited by r ds(on) single pulse t j = max rated r ja = 125 o c/w t a = 25 o c figure 12. 10 -4 10 -3 10 -2 10 -1 110 100 1000 0.5 1 10 100 1000 10000 single pulse r ja = 125 o c/w t a = 25 o c v gs = 10 v p ( pk ) , peak transient power (w) t, pulse width (sec) s i n g l e p u l s e m a x i m u m power dissipation typical characteristics t j = 25 c unless otherwise noted
www.fairchildsemi.com 5 FDMS7670 rev . d FDMS7670 n-channel powertrench ? mosfet figure 13. 10 -4 10 -3 10 -2 10 -1 110 100 1000 0.0005 0.001 0.01 0.1 1 2 single pulse r ja = 125 o c/w duty cycle-descending order normalized thermal impedance, z ja t, rectangular pulse duration (sec) d = 0.5 0.2 0.1 0.05 0.02 0.01 p dm t 1 t 2 notes: duty factor: d = t 1 /t 2 peak t j = p dm x z ja x r ja + t a junction-to-ambient transient thermal response curve figure 14. -120 -90 -60 -30 0 30 60 -5 0 5 10 15 20 25 di/dt = 300 a/ s time (ns) current (a) 0 30 60 90 120 150 180 -5 0 5 10 15 20 100 di/dt = 300 a/ s time (ns) current (a) b o d y d i o d e r e v e r s e recovery characteristics figure 15. typical characteristics t j = 25 c unless otherwise noted
www.fairchildsemi.com 6 FDMS7670 rev . d FDMS7670 n-channel powertrench ? mosfet dimensional outlin e and pad layout
FDMS7670 n-channel powertrench ? mosfet FDMS7670 rev . d 7 www.fairchildsemi.com trademarks the following includes registered and unregistered trademarks and se rvice marks, owned by fairchild semiconductor and/or its gl obal subsidiaries, and is not intended to be an exhaustive list of all such trademarks. *trademarks of system general corporation, used under license by fairchild semiconductor. disclaimer fairchild semiconductor reserves the right to make changes with out further notice to any products herein to improve reliability, function, or design. fairchild does not assume an y liability arising out of th e application or use of any product or circuit described herein; neither does it convey an y license under its patent rights, nor the rights of others. these specifications do not expand the terms of fairchild?s wo rldwide terms and conditions , specifically the warranty therein, which covers these products. life support policy fairchild?s products are not authorized fo r use as critical components in life support devices or systems without the express written approval of fa irchild semiconductor corporation. as used herein: 1. life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform w hen properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. a critical component in any component of a life support, device, or system whose failure to perform can be reasonably ex pected to cause the failure of the life support device or system, or to affect its safety or effectiveness. product status definitions definition of terms auto-spm? build it now? coreplus? corepower? crossvolt ? ctl? current transfer logic? ecospark ? efficentmax? ezswitch? * ?* fairchild ? fairchild semiconductor ? fact quiet series? fact ? fast ? fastvcore? fetbench? flashwriter ? * fps? f-pfs? frfet ? global power resource sm green fps? green fps? e-series? g max ? gto? intellimax? isoplanar? megabuck? microcoupler? microfet? micropak? millerdrive? motionmax? motion-spm? optologic ? optoplanar ? ? pdp spm? power-spm? powertrench ? powerxs? programmable active droop? qfet ? qs? quiet series? rapidconfigure? ? saving our world, 1mw /w /kw at a time? smartmax? smart start? spm ? stealth? superfet? supersot?-3 supersot?-6 supersot?-8 supremos? syncfet? sync-lock? ?* the power franchise ? ? tinyboost? tinybuck? tinylogic ? tinyopto? tinypower? tinypwm? tinywire? trifault detect? truecurrent?* serdes? uhc ? ultra frfet? unifet? vcx? visualmax? xs? tm ? tm tm datasheet identification product status definition advance information formative / in design datasheet contains the design specifications for product development. specifications may change in any manner without notice. preliminary first production datasheet contains preliminary data; supplementary data will be published at a later date. fairchild semiconductor reserves the ri ght to make changes at any time without notice to improve design. no identification needed full production datasheet contains final specifications. fair child semiconductor reserves the right to make changes at any time without notice to improve the design. obsolete not in production datasheet contains specifications on a product t hat is discontinued by fairchild semiconductor. the datasheet is for reference information only. anti-counterfeiting policy fairchild semiconductor corporation?s anti-counterfeiting policy. fairchild?s anti-counterfeiting policy is also stated on our external website, www.fairchildsemi.com, under sales support . counterfeiting of semiconductor parts is a growing problem in th e industry. all manufactures of semiconductor products are expe riencing counterfeiting of their parts. customers who inadvertently purchase counterfeit parts ex perience many problems such as loss of brand reputation, substa ndard performance, failed application, and increased cost of production and manufacturing dela ys. fairchild is taking strong measures to protect ourselve s and our customers from the proliferation of counterfeit parts. fairchild strongly encourages customers to purchase fairchild parts either directly from fa irchild or from authorized fairchild distributors who are listed by co untry on our web page cited above. products customers buy either from fairchild directly or fr om authorized fairchild distributors are genuine parts, have full traceability, meet fairchild?s quality standards for handing and storage and provide access to fairchild?s full range of up-to-date technical and product information. fairchild and ou r authorized distributors will stand behind all warranties and wi ll appropriately address and warranty issues that may arise. fairchild will not provide any warranty coverage or other assistance for parts bought from unau thorized sources. fairchild is committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors. rev. i40


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